Gas-solid high temperature in-situ XAFS device
Device parameters;
1. The device can switch between synchrotron radiation X-ray fluorescence test mode and transmission test mode
2. The device includes temperature controller, in situ chamber, heating system, upper computer software,
3. The device adopts PID intelligent control, USB signal transmission, temperature curve data acquisition, can be stored, can be accessed;
4. Can be multi-point temperature control correction, temperature limit setting, temperature can be set in multiple program segments,
5. Temperature range from normal temperature to 800℃, temperature control accuracy is less than 0.5℃, heating rate: 80℃/min
6. The device adopts resistance heating, and the sensor is placed under the sample, which can directly reflect the real temperature change of the sample
7. Sample diameter 11mm(customizable), window diameter 30mm,
8. Device window using polyimide, small signal loss, non-toxic
9. The device is sealed with O-ring, which is well sealed, can be vacuumed, and can be filled with reaction gas
10. The device is made of aviation aluminum, the shape of the device is 90mm*66mm*30mm, the net weight is less than 0.5Kg;
11 Chamber cooling method: using circulating water cooling;
12 The device is simple to operate, easy to install, and good test consistency