XAFS‑PEM In‑situ Test Device

1. Device Introduction

1)The device consists of two components: reaction component and heating component

2) Heating is realized by heating rod, and the probe is placed in the sample reaction zone

3)Power supply: 110V‑230V, with a safe 24V output

4) Heating range: room temperature‑100℃, temperature‑control accuracy: ±0.1℃

5) Multi‑segment temperature control is supported

6)Equipped with upper‑computer software and lower‑computer controller

2. Reaction Section

1)Titanium plates are used as current collectors, and the material can be replaced to meet different requirements

2) S‑shaped flow channel, width: 2 mm, reaction area: 20*20 mm (customizable)

3) Window dimension: 10*10 mm, window material: Kapton film

4) The device contains two electrodes, each provided with one inlet and one outlet for liquid or gas

5) The device can be designed to support both fluorescence and transmission modes