Controlled high temperature in situ X-ray test bench

Date:2024-08-27
Views:101

Device parameters;

1. The device includes temperature controller, in situ chamber, heating system, upper computer software, vacuum system

2. The device adopts PID intelligent control, USB signal transmission, temperature curve data acquisition, can be stored, can be accessed;

3. Can be multi-point temperature control correction, temperature limit setting, temperature can be set in multiple program segments,

4. The temperature range is normal temperature -1000℃, the temperature control accuracy is less than 0.3℃, and the heating rate is 80℃/min

5. The device adopts resistance heating, and the sensor is placed under the sample, which can directly reflect the real temperature change of the sample

6. The diameter of the heating table is 25mm, the window adopts the semi-spherical structure, the plane is 360° without shelter collection, and the imported PEEK material

8. The device is sealed with O-ring, which is well sealed, can be vacuumed, and can be filled with reaction gas

9. The device is made of aviation aluminum, the shape of the device is 110mm*80mm*50mm, the net weight is 0.5Kg;

10 chamber cooling method: using circulating water cooling;

11 Device. Simple operation, easy installation, good test consistency;

12. The device is widely used in major mainstream diffractometer brands and synchrotron radiation, no need to modify the instrument

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Beijing Zhongke Wanyuan Technology Co., Ltd. was established in 2014. Since its establishment, the company has been engaged in the research and development and manufacturing of in-situ test devices related to electrochemical materials. The company has excellent R & D team and machinery manufacturing, automation control team.
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