XAFS Gas‑Solid In‑situ Device

Device Parameters:

1. The device can switch between synchrotron‑radiation X‑ray fluorescence test mode and transmission test mode.

2. The device consists of temperature controller, in‑situ cell chamber, heating system and upper‑computer software.

3. PID intelligent control and USB signal transmission are adopted. Temperature curve data can be collected, stored and retrieved.

4. Multi‑point temperature calibration, temperature limit setting and multi‑segment temperature programming are supported.

5. Temperature range: room temperature‑800℃; temperature‑control accuracy: less than 0.5℃; heating rate: >80℃/min.

6. Resistance heating is used. The sensor is placed under the sample to reflect the real‑time temperature change of the sample accurately.

7. Sample diameter: 11 mm (customizable); window diameter: 30 mm.

8. Polyimide is used for the window, featuring low signal loss and non‑toxic property.

9. Sealed with O‑ring for good sealing performance. Vacuum pumping and reaction‑gas feeding are available.

10. Made of aviation aluminum. Overall dimension: 90 mm*66 mm*30 mm; net weight: less than 0.5 kg.

11. Chamber cooling mode: circulating‑water cooling.

12. Easy‑to‑operate and convenient for installation, with excellent test repeatability.